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Krupka, J., Geyer, R.G., Baker-Jarvis, J. and Ceremuga, J. (1996) Measure Ments of the Complex Permittivity of Microwave Circuit Board Substrates Using Split Dielectric Resonator and Reentrant Cavity Techniques. Seventh International Conference on Dielectric Materials, Measurements and Applications, Bath, UK, 23-26 September 1996, 21-24.
https://doi.org/10.1049/cp:19960982

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