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Kuo, C.F.J., Lo, W.C., Huang, Y.R., Tsai, H.Y., Lee, C.L. and Wu, H.C. (2017) Automated Defect Inspection System for CMOS Image Sensor with Micro Multi-Layer Non-Spherical Lens Module. Journal of Manufacturing Systems, 45, 248-259.
https://doi.org/10.1016/j.jmsy.2017.10.004

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