Article citationsMore>>

Strong, D. M., & Volkoff, O. (2010). Understanding Organization Enterprise System Fit: A Path to Theorizing the Information Technology Artifact. MIS Quarterly, 34, 731-756.
https://doi.org/10.2307/25750703

has been cited by the following article:

Follow SCIRP
Twitter Facebook Linkedin Weibo
Contact us
+1 323-425-8868
customer@scirp.org
WhatsApp +86 18163351462(WhatsApp)
Click here to send a message to me 1655362766
Paper Publishing WeChat
Free SCIRP Newsletters
Copyright © 2006-2024 Scientific Research Publishing Inc. All Rights Reserved.
Top