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Yadava, G.K., Kuhls-Gilcrist, A.T., Rudin, S., Patel, V.K., Hoffmann, K.R. and Bednarek, D.R. (2008) A Practical Exposure-Equivalent Metric for Instrumentation Noise in X-Ray Imaging Systems. Physics in Medicine & Biology, 53, 5107-5121.
https://doi.org/10.1088/0031-9155/53/18/017

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