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Park, J.H. Lee, S., Lee, H.S., Kim, S.K., Park, K.-S. and Yoon, S.-Y. (2018) Correlation between Spin Density and Vth Instability of IGZO Thin-Film Transistors. Current Applied Physics, 18, 1447-1450. https://doi.org/10.1016/j.cap.2018.08.016

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