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Rosling, M., Bleichner, H., Mundqvist, M. and Nordlander, E. (1992) A Novel Technique for the Simultaneous Measurement of Ambipolar Carrier Lifetime and Diffusion Coefficient in Silicon. Solid State Electronics, 35, 1223-1227.
https://doi.org/10.1016/0038-1101(92)90153-4

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