TITLE:
Multi-Memory Grouping Wrapper with Top Level BIST Algorithm
AUTHORS:
Narek Mamikonyan, Suren Abazyan, Vakhtang Janpoladov
KEYWORDS:
BIST, Memory Wrapper, Memory Bit
JOURNAL NAME:
Open Access Library Journal,
Vol.7 No.5,
April
24,
2020
ABSTRACT:
This algorithm integrates second level Built in self-test (BIST) into multiple memory grouping wrapper. Second level BIST brings additional reliability into the memory system while fastening testing time. Main approach is to test whole memory modules from top level by numerous step count of which can be modified based on power consumption requirement and overheat conditions. The worst case of the algorithm can be observed by the time when the number of steps is equal to the number of memory modules, otherwise the testing time will be relative to 1/N (N is the number of steps). The main advantage of memory wrapping methodology is the possibility of increasing variety of the number of bits and the number of cells in the memory, while using limited memories provided by foundry.