Article citationsMore>>

S. R. Jin, Y. L. Zheng and A. Z. Li, “Characterization of Photoluminescence Intensity and Efficiency of Free Ex- citons in Semiconductor Quantum Well Structures,” Jour- nal of Applied Physics, Vol. 82, No. 8, 1997, pp. 3870- 3973. doi: 10.1063/1.365689

has been cited by the following article:

Follow SCIRP
Twitter Facebook Linkedin Weibo
Contact us
+1 323-425-8868
customer@scirp.org
WhatsApp +86 18163351462(WhatsApp)
Click here to send a message to me 1655362766
Paper Publishing WeChat
Free SCIRP Newsletters
Copyright © 2006-2024 Scientific Research Publishing Inc. All Rights Reserved.
Top