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Dione, M.M., Diallo, H.L., Wade, M., Ly, I., Thiame, M., Toure, F., Camara, A.G., Dieme, N., Bako, Z.N., Mbodji, S., Barro, F.I. and Sissoko, G. (2011) Determination of the Shunt and Series Resistances of a Vertical Multijunction Solar Cell under Constant Multispectral Light. Proceedings of the 26th European Photovoltaic Solar Energy Conference, 250-254.
https://www.eupvsec-proceedings.com/
has been cited by the following article:
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TITLE:
Shunt Resistance Determination in a Silicon Solar Cell: Effect of Flow Irradiation Energy and Base Thickness
AUTHORS:
Ousmane Sow, Mamadou Lamine Ba, Hamet Yoro Ba, Mohamed Abderrahim Ould El Moujtaba, Youssou Traore, Masse Samba Diop, Habiboullah Lemrabott, Mamadou Wade, Grégoire Sissoko
KEYWORDS:
Silicon Solar Cell, Irradiation, Recombination Velocity, Shunt Resistance, Optimum Base Thickness
JOURNAL NAME:
Journal of Electromagnetic Analysis and Applications,
Vol.11 No.12,
December
5,
2019
ABSTRACT: The concept of the recombination of the minority carrier’s recombination velocity at the junction and in the rear, is used for determination, optimum thickness and then shunt resistance in the base of the silicon solar cell, maintained in steady state and under energy from the irradiation flow of charged particles. Resistance shunt is obtained and modeled through a relationship expressed according to the flow and energy of irradiation imposed on the solar cell.
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