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Dalibor, T., Pensl, G., Matsunami, H., Kimoto, T., Choyke, W.J., Schöner, A. and Nordell, N. (1997) Deep Defect Centers in Silicon Carbide Monitored with Deep Level Transient Spectroscopy. Physica Status Solidi (a), 162, 199-225.
https://doi.org/10.1002/1521-396X(199707)162:1<199::AID-PSSA199>3.0.CO;2-0

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