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Bhattacharyya, D., Sahoo, N.K., Thakur, S. and Das, N.C. (2000) Spectroscopic Ellipsometry of TiO2 Layers Prepared by Ion-Assisted Electron-Beam Evaporation. Thin Solid Films, 360, 96-102.
https://doi.org/10.1016/S0040-6090(99)00966-9

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