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Article citations


S. Zafar, K.A. Conrad, G. Liu, E. A. Irene, G. Hames, R. Kuehn and J. J. Wortman, “Thickness and Effective Electron Mass Measurements for Thin Silicon Dioxide Films Using Tunneling Current Oscillations,” Applied Physics Letters, Vol. 67, No. 7, 1995, pp.1031-1033. doi:10.1063/1.114720

has been cited by the following article: