Article citationsMore>>

N. Seliya, T. M. Khoshgoftaar and S. Zhong, “Analyzing Software Quality with Limited Fault-Proneness Defect Data,” Ninth IEEE International Symposium on High-Assurance Systems Engineering, HASE, Heidelberg, 2005, pp. 89-98.

has been cited by the following article:

Follow SCIRP
Twitter Facebook Linkedin Weibo
Contact us
+1 323-425-8868
customer@scirp.org
WhatsApp +86 18163351462(WhatsApp)
Click here to send a message to me 1655362766
Paper Publishing WeChat
Free SCIRP Newsletters
Copyright © 2006-2024 Scientific Research Publishing Inc. All Rights Reserved.
Top