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Tolley, A., Ferragut, R. and Somoza, A. (2009) Microstructural Characterization of a Commercial Al-Cu-Mg Alloy Combining Transmission Electron Microscopy and Positron Annihilation Spectroscopy. Philosophical Magazine, 89, 1095-1110. https://doi.org/10.1080/14786430902889674

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