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Article citations


J. D. Procunier, T. F. Townley Smith, S. Fox, S. Prashar, M. Gray, W. K. Kim, Czarnecki and P. L. Dyck, “PCR-Based RAPD/DGGE Markers Linked to Leaf Rust Resistance Genes Lr29 and Lr25 in Wheat (T. aestivum),” Journal of Genetics and Breeding, Vol. 49, No. 1, 1995, pp. 87-91.

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