J. D. Procunier, T. F. Townley Smith, S. Fox, S. Prashar, M. Gray, W. K. Kim, Czarnecki and P. L. Dyck, “PCR-Based RAPD/DGGE Markers Linked to Leaf Rust Resistance Genes Lr29 and Lr25 in Wheat (T. aestivum),” Journal of Genetics and Breeding, Vol. 49, No. 1, 1995, pp. 87-91. - References

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J. D. Procunier, T. F. Townley Smith, S. Fox, S. Prashar, M. Gray, W. K. Kim, Czarnecki and P. L. Dyck, “PCR-Based RAPD/DGGE Markers Linked to Leaf Rust Resistance Genes Lr29 and Lr25 in Wheat (T. aestivum),” Journal of Genetics and Breeding, Vol. 49, No. 1, 1995, pp. 87-91.

has been cited by the following article:

TITLE: Identification of Molecular Markers Linked to Leaf Rust Resistance Genes in Wheat and Their Detection in the Local Near-Isogenic Line

AUTHORS: Navjot Kaur Dhillon, Harcharan Singh Dhaliwal

KEYWORDS: RAPD, Lr9, Isogenic Lines

JOURNAL NAME: American Journal of Plant Sciences, Vol.2 No.3, September 30, 2011

ABSTRACT: Sixty-five random amplified polymorphic DNA (RAPD) primers were used for the detection of polymorphism among recipient and donor parents and their isogenic lines linked to leaf rust resistance genes, Lr9 and the resistant gene in kharchia local mutant KLM4-3B. Three primers showed polymorphism among recurrent parent, donor parent and isogenic lines.