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Matsushita, R., Sato, E. , Yanbe, Y., Chiba, H., Maeda, T., Hagiwara, O., Matsukiyo, H., Osawa, A., Enomoto, T., Watanabe, M., Kusachi, S., Sato, S., Ogawa, A. and Onagawa, J. (2013) Low-Dose-Rate Computed Tomography System Utilizing 25 mm/s-Scan Silicon X-Ray Diode and Its Application to Iodine K-Edge Imaging Using Filtered Bremsstrahlung Photons. Japanese Journal of Applied Physics, 52, 032202-1-5.
http://iopscience.iop.org/article/10.7567/JJAP.52.032202
https://doi.org/10.7567/JJAP.52.032202

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