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Kato, M., Yoshida, T., Ikeda, Y. and Kitagawara, Y. (1996) Transmission Electron Microscope Observation of “IR Scattering Defects” in As-Grown Czochralski Si Crystals. Japanese Journal of Applied Physics, 35, 5597-5601.
https://doi.org/10.1143/JJAP.35.5597
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