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Romano-Rodrí¹guez, A., Bachrouri, A, López, M., Morante, J.R., Misiuk, A., Surma, B. and Jun, J. (2000) TEM Characterization of High Pressure-High-Temperature-Treated Czochralski Silicon Samples. Materials Science and Engineering: B, 73, 250-254.
https://doi.org/10.1016/S0921-5107(99)00473-0

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