Article citationsMore>>

M. Leong, B. Doris, J. Kedzierski, K. Rim and M. Yang, “Silicon Device Scaling to the Sub-10-nm Regime,” Science, Vol. 306, No. 5704, 2004, pp. 2057-2060.

has been cited by the following article:

Follow SCIRP
Twitter Facebook Linkedin Weibo
Contact us
+1 323-425-8868
customer@scirp.org
WhatsApp +86 18163351462(WhatsApp)
Click here to send a message to me 1655362766
Paper Publishing WeChat
Free SCIRP Newsletters
Copyright © 2006-2024 Scientific Research Publishing Inc. All Rights Reserved.
Top