Article citationsMore>>

Cadieu, F.J., Vander, I., Rong, Y. and Zuneska, R.W. (2011) Glancing XRD and XRF for the Study of Texture Development in SmCo Based Films Sputtered Onto Silicon Substrates. Advances in X-Ray Analysis, 54-DXC 2010, 162-176 (Denver X-Ray Conf. 2010).

has been cited by the following article:

Follow SCIRP
Twitter Facebook Linkedin Weibo
Contact us
customer@scirp.org
WhatsApp +86 18163351462(WhatsApp)
Click here to send a message to me 1655362766
Paper Publishing WeChat
Free SCIRP Newsletters
Copyright © 2006-2021 Scientific Research Publishing Inc. All Rights Reserved.
Top