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Cadieu, F.J., Vander, I., Rong, Y. and Zuneska, R.W. (2011) Glancing XRD and XRF for the Study of Texture Development in SmCo Based Films Sputtered Onto Silicon Substrates. Advances in X-Ray Analysis, 54-DXC 2010, 162-176 (Denver X-Ray Conf. 2010).

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