TITLE:
Ferroelectricity in Layered Perovskites as a Model of Ultra-Thin Films
AUTHORS:
Masanori Fukunaga, Masaki Takesada, Akira Onodera
KEYWORDS:
Ferroelectricity, Layered Oxide, Perovskite, Thin Film, Size Effect
JOURNAL NAME:
World Journal of Condensed Matter Physics,
Vol.6 No.3,
August
12,
2016
ABSTRACT: The instability of thin ferroelectric films is discussed based on the close similarity of dielectric properties between bulk Bi-layered perovskites and thin BaTiO3 films. The dielectric properties of pseudo-two-dimensional layered perovskites suggest that the bulk layered ferroelectric is a good model of ultra-thin ferroelectric film with a few perovskite units, free from any misfit lattice strain. It seems plausible that the ferroelectric interaction is still prominent but shows a crossover from ferroelectric to antiferroelectric along the unique c-axis (perpendicular to the film plane); with decreasing thickness, the ferroelectricity appears within the plane, which results in so-called “canted ferroelectricity”. An extra relaxation mode induced by surface effect of thin films correlates with soft mode, which results in a new intermediate phase between the paraelectric and ferroelectric phases. These evidences may indicate no critical thickness even for ferroelectric ultra- thin films.