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Chang, M.H, Hsieh, C.Y., Chen, M.W. and Hwang, W. (2015) Logical Effort Models with Voltage and Temperature Extensions in Super-/Near-/Sub-Threshold Regions. 2011 International Symposium on VLSI Design, Automation and Test (VLSI-DAT), Hsinchu, 25-28 April 2011, 1-4.

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