Why Us? >>

  • - Open Access
  • - Peer-reviewed
  • - Rapid publication
  • - Lifetime hosting
  • - Free indexing service
  • - Free promotion service
  • - More citations
  • - Search engine friendly

Free SCIRP Newsletters>>

Add your e-mail address to receive free newsletters from SCIRP.


Contact Us >>

WhatsApp  +86 18163351462(WhatsApp)
Paper Publishing WeChat
Book Publishing WeChat
(or Email:book@scirp.org)

Article citations


Parfitt, M., Vickerman, J.C., Mitchell, R., Carr, C.M., Ince, N. and Knight, P. (2003) Surface Analysis of Softened Paper by Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and the Kawabata Evaluation System. Journal of Materials Science, 38, 2171-2177.

has been cited by the following article: