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K. Kobayashi, “Thermogravimetric and MOS Capacitor Properties for PbO-Bi2O3-B2O3-SiO2 Glass System,” Journal of Non-Crystalline Solids, Vol. 124, No. 2-3, 1990, pp. 229-232. doi:10.1016/0022-3093(90)90267-P

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