Kämper, K.-P., Schmitt, W., Güntherodt, G. and Kuhlenbeck, H. (1988) Thickness Dependence of the Electronic Structure of Ultrathin, Epitaxial Ni(111)/W(110) Layers. Physical Review B, 38, 9451-9456.
http://dx.doi.org/10.1103/PhysRevB.38.9451

has been cited by the following article:

• TITLE: Angle-Resolved and Resonant Photoemission Study of the Valence Bands of α-La(0001) on W(110)

  AUTHORS: Yoshiharu Enta, Osamu Morimoto, Hiroo Kato, Yasuo Sakisaka

  KEYWORDS: Lanthanum Thin Film, Electronic Structure, Valence Band, Tungsten Surface, Photoemission, Angle-Resolved Spectroscopy

  JOURNAL NAME: World Journal of Condensed Matter Physics, Vol.6 No.1, February 3, 2016

  ABSTRACT: We report a photoelectron spectroscopic study of the valence bands of double hexagonal-close-packed (dhcp) α-La(0001) films epitaxially grown on W(110) at room temperature. The La 5d photoemission cross section in the photon energy region from 20 eV to 130 eV was obtained and the valence-band structure of α-La was determined. Except for 4f-related structures, the valence-band structures of dhcp α-La and dhcp β-Ce were found to resemble each other. From the band structure, the crystal structure of the La film was confirmed. No evidence for the existence of a 5d-like surface state near the Fermi energy at the point of the surface Brillouin zone was obtained and a 6s band bottom was identified.