Article citationsMore>>

Philipps, J., Pretschner, A., Slotosch, O., Aiglstorfer, E., Kriebel, S. and Scholl, K. (2003) Model-Based Test Case Generation for Smart Cards. Electronic Notes in Theoretical Computer Science, 80, 170-184.
http://dx.doi.org/10.1016/S1571-0661(04)80817-X

has been cited by the following article:

Follow SCIRP
Twitter Facebook Linkedin Weibo
Contact us
+1 323-425-8868
customer@scirp.org
WhatsApp +86 18163351462(WhatsApp)
Click here to send a message to me 1655362766
Paper Publishing WeChat
Free SCIRP Newsletters
Copyright © 2006-2024 Scientific Research Publishing Inc. All Rights Reserved.
Top