Dadamirzaev, M.G. (2015) Influence of Deformation on CVC p-n-Junction in a Strong Microwave Field. Journal of Modern Physics-USA, 6, 176-180.
http://dx.doi.org/10.4236/jmp.2015.62023

has been cited by the following article:

• TITLE: EMF of Hot Charge Carriers Arising at the p-n-Junction under the Influence of the Microwave Field and Light

  AUTHORS: Gafur Gulyamov, Muhammadjon Gulomkodirovich Dadamirzaev, Nosir Yusupjanovich Sharibayev, Ne’matjon Zokirov

  KEYWORDS: photocurrent lasing and recombination currents, hot electrons, the microwave field, light, p-n-junction

  JOURNAL NAME: Journal of Electromagnetic Analysis and Applications, Vol.7 No.12, December 10, 2015

  ABSTRACT: It is shown that the increase in the current of an asymmetric p-n-junction, caused by perturbation of potential barrier height and increasing recombination current in a strong microwave field, is suppressed by light generated photo carriers, leading to the displacement of current-voltage characteristics of p-n-junction into the direction of smaller current values.