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Park, Y.S., Park, C.M., Park, C.J., Cho, H.J., Lee, S.J., Kang, T.W., Lee, S.H., Oh, J.E., Yoo, K.H. and Son, M.S. (2006) Electron Trap Level in a GaN Nanorod p-n Junction Grown by Molecular-Beam Epitaxy. Applied Physics Letters, 88, Article ID: 192104.
http://dx.doi.org/10.1063/1.2203735
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