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Bange, J.P., Singh, M.K., Kano, K., Miura, K. and Hanaizumi, O. (2011) Structural Analysis of RF Sputtered Er Doped Ta2O5 Films. Key Engineering Materials, 459, 32-37.
http://dx.doi.org/10.4028/www.scientific.net/KEM.459.32

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