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Hemraj-Benny, T., Banerjee, S., Sambasivan, S., Balasubramanian, M., Fischer, D.A., Eres, G., Puretzky, A.A., Geohegan, D.B., Lowndes, D.H., Han, W.Q., Misewich, J.A. and Wong, S.S. (2005) Near-Edge X-Ray Absorption Fine Structure Spectroscopy as a Tool for Investigating Nanomaterials. Small, 2, 26-35.
http://dx.doi.org/10.1002/smll.200500256

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