Leinhos, J. and Arz, U. (2008) Monte-Carlo Analysis of Measurement Uncertainties for On-Wafer Thru-Reflect-Line Calibrations. IEEE Transactions on Microwave Symposium Digest, 22, 33-36. http://dx.doi.org/10.1109/MWSYM.2008.4633327
has been cited by the following article:
Related Articles: