Article citationsMore>>

Wu, M.K., Wei, J.S., Shih, H.C. and Ho, C.C. (2009) License Plate Detection Based on 2-Level 2D Haar Wavelet Transform and Edge Density Verification. IEEE International Symposium on Industrial Electronics, Seoul, 5-8 July 2009, 1699-1704. http://dx.doi.org/10.1109/ISIE.2009.5214275

has been cited by the following article:

Follow SCIRP
Twitter Facebook Linkedin Weibo
Contact us
+1 323-425-8868
customer@scirp.org
WhatsApp +86 18163351462(WhatsApp)
Click here to send a message to me 1655362766
Paper Publishing WeChat
Free SCIRP Newsletters
Copyright © 2006-2024 Scientific Research Publishing Inc. All Rights Reserved.
Top