Article citationsMore>>

French, R.H., Muèllejans, H., Jones, D.J., Duscher, G., Cannon, R.M. and Ruèhle, M. (1998) Dispersion Forces and Hamaker Constants for Intergranular Films in Silicon Nitride from Spatially Resolved-Valence Electron Energy Loss Spectrum Imaging. Acta Materialia, 46, 2271-2287.
http://dx.doi.org/10.1016/S1359-6454(98)80008-6

has been cited by the following article:

Follow SCIRP
Twitter Facebook Linkedin Weibo
Contact us
+1 323-425-8868
customer@scirp.org
WhatsApp +86 18163351462(WhatsApp)
Click here to send a message to me 1655362766
Paper Publishing WeChat
Free SCIRP Newsletters
Copyright © 2006-2024 Scientific Research Publishing Inc. All Rights Reserved.
Top