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Roorda, S., Sinke, W.C., Poate, J.M., Jacobson, D.C., Dierker, S., Dennis, B.S., Eaglesham, D.J., Spaepen, F. and Fuoss, P. (1991) Structural Relaxation and Defect Annihilation in Pure Amorphous Silicon. Physical Review B, 44, 3702-3725.

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