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Zhang, H., Ye, Zh., Zhao, B. and Liu, H. (2000) X-Ray Diffraction, Photoluminescence and Secondary Ion Mass Spectroscopy Study of GaN Films Grown on Si(111) Substrate by Vacuum Reactive Evaporation. Semiconductor Science Technology, 15, 649-652. http://dx.doi.org/10.1088/0268-1242/15/7/301

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