Hermsm, M., Fukuzawa, M., Melov, V.G., Schreiber, J., Mock, P. and Yamada, M. (2000) Residual Strain in Annealed GaAs Single-Crystal Wafers as Determined by Scanning Infrared Polariscopy, X-Ray Diffraction and Topography. Journal of Crystal Growth, 210, 172-176. http://dx.doi.org/10.1016/S0022-0248(99)00673-9

has been cited by the following article:

• TITLE: Modeling of Orientation-Dependent Photoelastic Constants in Cubic Crystal System

  AUTHORS: Lubna Jahan Rashid Pinky, Shakila Islam, Md. Nur Kutubul Alam, Mohammad Arif Hossain, Md. Rafiqul Islam

  KEYWORDS: Mathematical Modeling; Photoelastic Constants; Arbitrary Crystal Orientation; Euler’s Rotation Theorem; Tensor Rotation Technique

  JOURNAL NAME: Materials Sciences and Applications, Vol.5 No.4, March 28, 2014

  ABSTRACT: Euler’s rotation theorem and tensor rotation technique are applied to develop a generalized mathematical model for determining photoelastic constants in arbitrary orientation of cubic crystal system. Two times rotations are utilized in the model relating to crystallographic coordinates with Cartesian coordinates. The symmetry of photoelastic constants is found to have strong dependence with rotation angle. Using the model, one can determine photoelastic constants in any orientation by selecting appropriate rotation angle. The outcome of this study helps to characterize spatial variation of residual strain in crystalline as well as polycrystalline materials having cubic structure using the experimental technique known as scanning infrared polariscope.