Article citationsMore>>

A. Das, A. K. Geim, et al., “Monitoring Dopants by Raman Scattering in an Electrochemically Top-Gated Graphene Transistor,” Nature Nanotechnology, Vol. 3, 2008, p. 210. http://dx.doi.org/10.1038/nnano.2008.67

has been cited by the following article:

Follow SCIRP
Twitter Facebook Linkedin Weibo
Contact us
+1 323-425-8868
customer@scirp.org
WhatsApp +86 18163351462(WhatsApp)
Click here to send a message to me 1655362766
Paper Publishing WeChat
Free SCIRP Newsletters
Copyright © 2006-2024 Scientific Research Publishing Inc. All Rights Reserved.
Top