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A. Altes, R. Tilgner and W. Walter, “Numerical Evaluation of Miniaturized Resistive Probe for Quantitative Thermal Near-Field Microscopy of Thermal Conductivity,” Microelectronics Reliability, Vol. 46, No. 9-11, 2006, pp. 1525-1529. doi:10.1016/j.microrel.2006.07.030

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