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D. H. Kalantar, M. H. Key, L. B. Da Silva, et al., “Measurement of 0.35 μm Laser Imprint in a Thin Si Foil Using an X-Ray Laser Backlighter,” Physical Review Letters, Vol. 76, 1996, 19, pp. 3574-3577.
http://dx.doi.org/10.1103/PhysRevLett.76.3574

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