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G. Goerigk and D. L. Williamson, “Temperature Induced Differences in the Nanostructure of Hot-Wire Deposited Silicon-Germanium Alloys Analyzed by Anomalous Small-Angle X-Ray Scattering,” Journal of Applied Physics, Vol. 99, No. 8, 2006, Article ID: 084309. http://dx.doi.org/10.1063/1.2187088

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