N. Derrier, A. Rumiantsev and D. Celi, “State-of-the-Art and Future Perspectives in Calibration and De-Embedding Techniques for Characterization of Advanced SiGe HBTs Featuring Sub-THz fT/fMAX,” 2012 IEEE Bipolar/ BiCMOS Circuits and Technology Meeting (BCTM), Portland, 30 September-3 October 2012, pp. 1-8.

has been cited by the following article:

• TITLE: Limitations of On-Wafer Calibration and De-Embedding Methods in the Sub-THz Range

  AUTHORS: Manuel Potereau, Christian Raya, Magali De Matos, Sébastien Fregonese, Arnaud Curutchet, Min Zhang, Bertrand Ardouin, Thomas Zimmer

  KEYWORDS: TRL; Open-Short; De-Embedding; Calibration

  JOURNAL NAME: Journal of Computer and Communications, Vol.1 No.6, November 26, 2013

  ABSTRACT: This paper investigates frequency limitations of calibration and de-embedding techniques for S parameter measurements. First, the TRL calibration methods are analysed and the error due to the probe movement when measuring the different line lengths is quantified, next the coupling between the probe-heads and the wafer surface is investigated and finally an upper frequency validity limit for the standard Open-Short de-embedding method is given. The measured results have been confirmed thanks to the use of an electro-magnetic simulator.