TITLE:
Research on the Dark Stripes Extraction Algorithm for Measuring Diameter with Diffraction
AUTHORS:
Quan Liu, Fenglin Wei
KEYWORDS:
Diffraction; Diameter Measurement; Dark Stripes Extract; Least Squares Fitting
JOURNAL NAME:
Optics and Photonics Journal,
Vol.3 No.2B,
July
18,
2013
ABSTRACT:
The optical diffraction is a major means of minute
diameter measurements. Since the light intensity of the diffraction fringe,
mainly distributed in the central bright stripes, and that will lead to a
relatively low SNR for the signal of the senior stripes. The traditional dark
stripes extraction algorithm affected greatly by the noise. So this paper
presents an algorithm that could effectively eliminate the gross errorcaused by
the noise. Than by curve fitting the local signal of the diffraction pattern
with the least square principle, the system could achieve a high measurement
precision.