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V. B. Molodkin, S. I. Olikhovskii, E. G. Len1, B. V. Sheludchenko1, et al., “X-Ray Diffraction Characterization of Microdefects in Silicon Crystals after High Energy Electron Irradiation,” Physica Status Solidi (A), Vol. 208, No. 11, 2011, pp. 2552-2557. doi:10.1002/pssa.201184253

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