[1]
|
Jain, S.C., Willander, M., Narayan, J. and Van Overstraeten, R. (2000) III-nitride: Growth, characterization and properties. Journal of Applied Physics, 87, 965.
doi:10.1063/1.371971
|
[2]
|
Nakamura, S., Pearton, S.J. and Fasal, G. (2000) The blue LASER diodes. Springer, Berlin.
|
[3]
|
Look, D.C. and Sizelove, J.R. (1999) Dislocation Scattering in GaN. Physical Review Letter, 82, 1237.
doi:10.1103/PhysRevLett.82.1237
|
[4]
|
Dutikrushna, P., Sarkar, C.K., Mukhopadhyay, D. and Mallick, P.S. (2005) Hot electron microwave incremental conductivity of GaN. Journal of Optics, 34, 172-175.
|
[5]
|
Hosein, E. (2009) The effect of hydrostati pressure on material parameters and electrical transport properties in bulk GaN. Physics Letters A, 373, 1773-1776.
doi:10.1016/j.physleta.2009.03.013
|
[6]
|
Ng, H.M., Doppalapudi, D., Moustakas, T.D., Weimann, N.G. and Eastman, L. F. (1998) The role of dislocation scattering in n type GaN films. Applied Physical Letters, 73, 821. doi:10.1063/1.122012
|
[7]
|
Weimann, N.G., Eastman, L.F., Doppalapudi, D., Ng, H.M. and Moustakas, T.D. (1998) Scattering of electrons at threading dislocations in GaN. J. Appl. Phys. 83, 3656.
doi:10.1063/1.366585
|
[8]
|
Dhar Subhabrata and Ghosh Subhasis (1999) Low field electron mobility in GaN. Journal of Applied Physics, 86, 2668. doi:10.1063/1.371108
|
[9]
|
Erginsoy, C. (1950) Neutral impurity scattering in semiconductors. Physical Review, 79, 1013.
doi:10.1103/PhysRev.79.1013
|
[10]
|
Nag, B.R. (1980), Electron transport in compound semi- conductors. Springer-Verlag, Berlin.
|
[11]
|
Look, D.C. (1989) Electrical characterization of GaAs materials and devices. Willey, New York.
|
[12]
|
Lin, M.E., Sverdiov, B.N., Strite, S., Morkoe, H. and Drakin, A.E. (1993) Refractive indices of Wurtzite and Zincblende GaN. Electronics Letters, 29, 1759.
doi:10.1049/el:19931172
|
[13]
|
Wang, Y.J., Kaplan, R., Ng, H.K., Doverspike, K., Gaskil, D.K., Ikedo, T., Amano, H. and Akasaki, I. (1996) Magneto-optical studies of GaN and GaN/AlxGa1-xN: Donor zeeman spectroscopy and two dimensional electron gas cyclotron resonance. Journal of Applied Physics, 79, 8007. doi:10.1063/1.362351
|
[14]
|
Morkoc, H. (1999) Nitride Semiconductors and devices, Springer-Verlag, Heidelberg/Berlin/New York.
doi:10.1007/978-3-642-58562-3
|
[15]
|
Schroeder, D.K. (1990), Semiconductor material and device characterization. Wiley, New York.
|
[16]
|
Bykhovski, A.D., Kaminski, V.V., Shur, M.S., Chen, Q.C. and Khan, M.A. (1996) Piezoelectric effect in wurtzite n type GaN. Applied Physical Letters, 68, 818.
doi:10.1063/1.116543
|
[17]
|
Shan, W., Schmidt, S., Yang, X.H., Song, J.J. and Goldenberg, B. (1996) Optical properties of wurtzite GaN grown by low-pressure metalorganic chemical-vapor deposition. Journal of Applied Physics, 79, 3691.
doi:10.1063/1.361200
|
[18]
|
Perlin, P., Staszewska, E.L. and Suchanek, B. (1996) Determination of the effective mass of GaN from infrared reflectivity and Hall effect. Applied Physical Letters, 68, 1114. doi:10.1063/1.115730
|
[19]
|
Djeffal, F., Arar, D., Lakhdar, N., Bendib, T., Dibi, Z. and Chahdi, M. (2009) An approach based on particles warm computation to study the electron mobility in wurtzite GaN. Microelectronics Journal, 40, 357-359.
doi:10.1016/j.mejo.2008.07.041
|