The Use of Phase Portraits for the Study of the Generation-Recombination Processes in Semiconductor

Gafur Gulyamov^1*, A. G. Gulyamov², A. Q. Ergashev¹, B. T. Abdulazizov³

¹Namangan Engineering-Pedagogical Institute, Namangan, Uzbekistan.
²Physico-Technical Institute, Academy of Sciences of Uzbekistan, Tashkent, Uzbekistan.
³Namangan State University, Namangan, Uzbekistan.

DOI: 10.4236/jmp.2015.613197                

Abstract

Theoretical investigation of generation-recombination processes in silicon, which has a lifetime of charge carriers 10^-3 s and capture cross sections of 10^-16 sm². For the study uses a method of phase portraits, which are widely used in the theory of vibrations. It is shown that the form of phase portraits strongly depends on the frequency of exposure to the external variable deformation.

Keywords

Phase Portraits, The Generation of Charge Carriers, The Recombination of Charge Carriers

Conflicts of Interest

The authors declare no conflicts of interest.

References

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