Effects of Si-Layer-Thickness Ratio on UV-Light-Emission Intensity from Si/SiO2 Multilayered Thin Films Prepared Using Radio-Frequency Sputtering

Kenta Miura; Hitomi Hoshino; Masashi Honmi; Osamu Hanaizumi

doi:10.4236/msa.2015.63025

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Materials Sciences and Applications > Vol.6 No.3, March 2015

Effects of Si-Layer-Thickness Ratio on UV-Light-Emission Intensity from Si/SiO₂ Multilayered Thin Films Prepared Using Radio-Frequency Sputtering ()

Kenta Miura^*, Hitomi Hoshino, Masashi Honmi, Osamu Hanaizumi

Graduate School of Science and Technology, Gunma University, Kiryu, Japan.

DOI: 10.4236/msa.2015.63025 PDF HTML XML 2,481 Downloads 2,871 Views Citations

Abstract

We investigated the effects of Si-layer-thickness ratios on ultraviolet (UV) peak intensities of Si/ SiO₂ multilayered films produced by alternately stacking several-nanometer-thick Si and SiO₂ layers using radio-frequency sputtering for the first time. The Si-layer-thickness ratio of the Si/SiO₂ film is a very important parameter for enhancing the peak intensity because the ratio is concerned with the size of Si nanocrystals in the film, which might affect the intensity of the UV light emission from the film. We prepared seven samples with various estimated Si-layer-thickness ratios, and measured the photoluminescence spectra of the samples after annealing at 1150°C, 1200°C, or 1250°C for 25 min. From our experiments, we estimate that the proper Si-layer-thickness ratio to obtain the strongest UV peaks from the Si/SiO₂ multilayered films is around 0.29. Such a UV-lightemitting thin film is expected to be used in future higher-density optical-disk systems.

Keywords

Si, SiO₂, Multilayer, Sputtering, UV-Light Emission

Share and Cite:

Miura, K. , Hoshino, H. , Honmi, M. and Hanaizumi, O. (2015) Effects of Si-Layer-Thickness Ratio on UV-Light-Emission Intensity from Si/SiO₂ Multilayered Thin Films Prepared Using Radio-Frequency Sputtering. Materials Sciences and Applications, 6, 215-219. doi: 10.4236/msa.2015.63025.

Conflicts of Interest

The authors declare no conflicts of interest.

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