Investigation on the Effect of Film Thickness on the Surface Morphology, Electrical and Optical Properties of E-Beam Deposited Indium Tin Oxide (ITO) Thin Film

Golam Saklayen, Shahinul Islam, Ferdous Rahman, Abu Bakar Ismail

Department of Applied Physics and Electronic Engineering, Rajshahi University, Rajshahi, Bangladesh.

DOI: 10.4236/ampc.2014.410023                

Abstract

  The following article has been retracted due to the fact that the authors practise fraud. The scientific community takes a very strong view on this matter, and the Advances in Materials Physics and Chemistry treats all unethical behavior seriously. This paper published in Vol. 4 No. 10 194-202, 2014 has been removed from this site.

  Title: Investigation on the Effect of Film Thickness on the Surface Morphology, Electrical and Optical Properties of E-Beam Deposited Indium Tin Oxide (ITO) Thin Film

  Authors: Golam Saklayen, Shahinul Islam, Ferdous Rahman, Abu Bakar Ismail

Keywords

E-Beam Deposition, Surface Morphology, Thin Films, EDX, Atomic Force Microscopy, SEM, Annealing, Electrical and Optical Properties

Conflicts of Interest

The authors declare no conflicts of interest.

References

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