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The Effect of Carbon Rod—Specimens Distance on the Structural and Electrical Properties of Carbon Nanotube

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DOI: 10.4236/wjnse.2014.43014    2,735 Downloads   3,292 Views  

ABSTRACT

The research studies the effect of the distance between the sample and the plasma sputtering source on the properties of the junction (silicon wafer-carbon nanotubes). The silicon wafer is fixed at (near, medium and far distances from the plasma source which is in the form of high purity graphite rod heated electrically). For the three cases, thickness of the sample is constant (20 nm). The samples were studied by scanning electron (SEM) and atomic force microscopes (AFM), X-ray and Raman spectra. For optimum distances the carbon layer is in the form of multi wall carbon nanotube (MWCNT). SEM images shows no formation of CNT on the Si wafer for near distance, which is consistent with the AFM images, X-ray and Raman spectrograms and no existence of characteristics (002) peaks whereas it appears for medium and longer distances, and by experience the optimum distance was found. This means that at closer distance high energy and high intensity plasma particles prevent the formation of CNT. This effect decreases with increasing distance of substrate from the graphite rod.

Conflicts of Interest

The authors declare no conflicts of interest.

Cite this paper

Uonis, M. , Mustafa, B. and Ezzat, A. (2014) The Effect of Carbon Rod—Specimens Distance on the Structural and Electrical Properties of Carbon Nanotube. World Journal of Nano Science and Engineering, 4, 105-110. doi: 10.4236/wjnse.2014.43014.

References

[1] Poole Jr., C.P. and Owens, F.J. (2003) Introduction to Nanotechnology. John Wiley & Sons, Inc., Hoboken.
[2] Seshan, K. (2001) Handbook of Thin-Film Deposition Processes and Techniques, Principles, Methods, Equipment and Applications. Noyes Publications/William Andrew Publishing, New York.
[3] Rümmeli, M.H., Bachmatiuk, A., Borrnert, F., Schaffel, F., Ibrahim, I., Cendrowski, K., Simha-Martynkova, G., Plachá, D., Borowiak-Palen, E., Cuniberti, G. and Büchner, B. (2011) Synthesis of Carbon Nanotubes with and without Catalyst Particles. Nanoscale Research Letters, 6, 303.
http://dx.doi.org/10.1186/1556-276X-6-303
[4] Hofmann, S., Kleinsorge, B., Ducati, C., Ferrari, A.C. and Robertson, J. (2004) Low-Temperature Plasma Enhanced Chemical Vapor Deposition of Carbon Nanotubes. Diamond and Related Materials, 13, 1171-1176.
http://dx.doi.org/10.1016/j.diamond.2003.11.046
[5] Gan, K.J., Chang, C.H., Lu, J.J., Lin, C.L., Su, Y.K., Li, B.J. and Yeh, W.K. (2011) Growth of Carbon Nanotube Using Microwave Plasma Chemical Vapor Deposition and Its Application to Thermal Dissipation of High-Brightness Light Emitting Diode. WCE 2011, London, 6-8 July 2011.
[6] Choi, Y.C., Bae, D.J., Lee, Y.H. and Lee, B.S. (2000) Growth of Carbon Nanotubes by Microwave Plasma-Enhanced Chemical Vapor Deposition at Low Temperature. Journal of Vacuum Science & Technology A, 18, 1864.
http://dx.doi.org/10.1116/1.582437
[7] Jorio, A., Pimenta, M.A., Souza Filho, A.G., Saito, R., Dresselhaus, G. and Dresselhaus, M.S. (2003) Characterizing Carbon Nanotube Samples with Resonance Raman Scattering. New Journal of Physics, 5, 139.1-139.17.
[8] Bokova, S.N., Obraztsova, E.D., Grebenyukov, V.V., Elumeeva, K.V., Ishchenko, A.V. and Kuznetsov, V.L. (2010) Raman Diagnostics of Multi-Wall Carbon Nanotubes with a Small Wall Number. Physica Status Solidi (B), 247, 2827- 2830.
http://dx.doi.org/10.1002/pssb.201000237
[9] Lehman, J.H., Terrones, M., Mansfield, E., Hurst, K.E. and Meunier, V. (2011) Evaluating the Characteristics of Multiwall Carbonnanotubes. Carbon, 49, 2581-2602.
http://dx.doi.org/10.1016/j.carbon.2011.03.028
[10] Oddershede, J., Nielsen, K. and Stahl, K. (2007) Using X-Ray Powder Diffraction and Principal Component Analysis to Determine Structural Properties for Bulk Samples of Multiwall Carbon Nanotubes. Zeitschrift für Kristallographie, 222, 186-192.
[11] Zdrojek, M., Gebicki, W., Jastrzebski, C., Melin, T. and Huczko, A. (2004) Studies of Multiwall Carbon Nanotubes Using Raman Spectroscopy and Atomic Force Microscopy. Solid State Phenomena, 99-100, 265-268.
http://dx.doi.org/10.4028/www.scientific.net/SSP.99-100.265
[12] Bellucci, S., Gaggiotti, G., Marchetti, M., Micciulla, F., Mucciato, R. and Regi, M. (2007) Atomic Force Microscopy Characterization of Carbon Nanotubes. Journal of Physics: Conference Series, 61, 99-104.

  
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