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Optical and Structural Properties of ZnO Thin Films Fabricated by Sol-Gel Method

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DOI: 10.4236/msa.2011.25044    15,690 Downloads   33,345 Views   Citations

ABSTRACT

Highly oriented and transparent ZnO thin films have been fabricated on ultrasonically cleaned quartz substrates by the sol-gel technique. X-ray diffraction, UV-VIS, FTIR, photoluminescence and SEM are used to characterize ZnO thin films. X-ray diffraction study show that all the films prepared in this work have hexagonal wurtzite structure, with lattice constants a = b = 3.260 Å, c = 5.214 Å. The optical band gap energy of the thin films is found to be direct allowed transition ~3.24 eV. The FTIR spectrum of the film has the characteristics ZnO absorption band at 482 cm?1. The photoluminescence spectrum of the samples has an UV emission peak centred at 383 nm with broad band visible emission centred in the range of 500 - 600 nm.

Conflicts of Interest

The authors declare no conflicts of interest.

Cite this paper

Z. Khan, M. Khan, M. Zulfequar and M. Shahid Khan, "Optical and Structural Properties of ZnO Thin Films Fabricated by Sol-Gel Method," Materials Sciences and Applications, Vol. 2 No. 5, 2011, pp. 340-345. doi: 10.4236/msa.2011.25044.

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