[1]
|
Ganeev, R.A., Ryasnyanskii, A.I., Kodirov, M.K., Kamalov, S.R., Li, V.A., Tugushev, R.I. and Usmanov, T. (2002) Technical Physics, 47, 889-893. http://dx.doi.org/10.1134/1.1495054
|
[2]
|
Granmayeh Rad, A., Abbasi, H. and Golyari, K. (2012) International Journal of Applied Physics and Mathemics, 2, 135-139.
|
[3]
|
Granmayeh Rad, A., Nabavi, S.H., Koohian, A. and Madanipour, Kh. (2011) Journal of Theoretical and Applied Physics, 5, 35-39
|
[4]
|
Jia, T., He, T., Li, P., Mo, Y. and Cui, Y. (2008) Optics & Laser Technology, 40, 936-940. http://dx.doi.org/10.1016/j.optlastec.2008.01.007
|
[5]
|
Mukherjee, A. (1993) Applied Physics Letters, 62, 3423-3425. http://dx.doi.org/10.1063/1.109036
|
[6]
|
Marder, S.R., Torrullas, W.E., Blanchard-Desce, M., Ricci, V., Stegman, G.I., Gilmour, S., Bredas, J.L., Li, J., Bublitz, G.U. and Boxer, S.G. (1997) Science, 276, 1233-1236. http://dx.doi.org/10.1126/science.276.5316.1233
|
[7]
|
Li, C., Zhang, L., Yang, M., Wang, H. and Wang Y. (1994) Physical Review A, 49, 1149-1157. http://dx.doi.org/10.1103/PhysRevA.49.1149
|
[8]
|
Guo, S.L., Xu, L., Wang, H.T., You, X.Z. and Ming, N.B. (2003) Optical and Quantum Electronics, 35, 693-703. http://dx.doi.org/10.1023/A:1023981924486
|
[9]
|
Sheik-Bahaei, M., Said, A.A. and Van Stryland, E.W. (1989) Optics InfoBase: Optics Letters, 14, 955-957. http://dx.doi.org/10.1364/OL.14.000955
|
[10]
|
Sheik-Bahaei, M. and Van Stryland, E.W. (1998) Z-Scan Measurements of Optical Nonlinearities, Characterization Techniques and Tabulations for Organic Nonlinear Materials. In: Kuzyk, M.G. and Dirk, C.W., Eds., Marcel Dekker, Inc., 655-692.
|
[11]
|
Ménard, J.M., Betz, M., Sigal, I. and van Driel, H.M. (2007) Applied Optics, 46, 2119-2122. http://dx.doi.org/10.1364/AO.46.002119
|